Localization of off-stress-induced damage in AlGaNGaN HEMTs by means of low frequency 1/f noise measurements

Silvestri, MarcoMarcoSilvestriUren, MichaelMichaelUrenKillat, NicolleNicolleKillatMarcon, DenisDenisMarconKuball, MartinMartinKuball2021-10-212021-10-2120130003-6951https://imec-publications.be/handle/20.500.12860/23083Localization of off-stress-induced damage in AlGaNGaN HEMTs by means of low frequency 1/f noise measurementsJournal article10.1063/1.4816424