Evaluating latchup (LU) risk in advanced CMOS technologies

Serbulova, KaterynaKaterynaSerbulovaGroeseneken, GuidoGuidoGroesenekenChen, Shih-HungShih-HungChenHellings, GeertGeertHellings2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/35924Evaluating latchup (LU) risk in advanced CMOS technologiesMeeting abstracthttps://www.esda.org/assets/Events/4cf93e2446/IEW-2020-program-1-3-2020.pdf