Alavi, OmidOmidAlaviDe Ceuninck, WardWardDe CeuninckDaenen, MichaëlMichaëlDaenen2024-08-062024-06-202024-08-0620241996-1073WOS:001245556600001https://imec-publications.be/handle/20.500.12860/44067Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling TestsJournal article10.3390/en17112616WOS:001245556600001JUNCTION TEMPERATURE-MEASUREMENTIGBT MODULESSEMICONDUCTOR-DEVICESRELIABILITYPREDICTIONIDENTIFICATIONVALIDATIONCYCLER