Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques

Kerner, ChristophChristophKernerCiofi, IvanIvanCiofiChiarella, ThomasThomasChiarellaVan Huylenbroeck, StefaanStefaanVan Huylenbroeck2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20914Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniquesProceedings paper