Talmat, RachidaRachidaTalmatPut, SofieSofiePutCollaert, NadineNadineCollaertMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeysGuo, W.W.GuoCretu, B.B.CretuBenfdila, A.A.BenfdilaRoutoure, J.-M.J.-M.RoutoureCarin, R.R.CarinSimoen, EddyEddySimoen2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/18068High-temperature characterization of advanced strained nMUGFETsProceedings paper