Automatic generation of in-circuit tests for board assembly Defects

van Schaaijk, HarmHarmvan SchaaijkSpierings, MartienMartienSpieringsMarinissen, Erik JanErik JanMarinissen2021-10-262021-10-262018-05https://imec-publications.be/handle/20.500.12860/32104Automatic generation of in-circuit tests for board assembly DefectsProceedings paperhttps://ieeexplore.ieee.org/document/8400714/