A defect-centric perspective on channel hot carrier variability in nMOSFETs

Procel, Luis MiguelLuis MiguelProcelCrupi, FeliceFeliceCrupiFranco, JacopoJacopoFrancoTrojman, LionelLionelTrojmanKaczer, BenBenKaczerWils, N.N.WilsTuinhout, H.H.Tuinhout2021-10-222021-10-2220150167-9317https://imec-publications.be/handle/20.500.12860/25774A defect-centric perspective on channel hot carrier variability in nMOSFETsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0167931715002671