Magnone, P.P.MagnoneCrupi, F.F.CrupiIannacone, G.G.IannaconeGiusi, G.G.GiusiPace, C.C.PaceSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14098A model for MOS gate stack quality evaluation based on the gate current 1/f noiseProceedings paper