NBTI lifetime prediction and kinetics at operation bias based on ultrafast pulse measurement

Ji, ZhigangZhigangJiLin, L.L.LinZhang, Jian FuJian FuZhangKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-1820100018-9383https://imec-publications.be/handle/20.500.12860/17324NBTI lifetime prediction and kinetics at operation bias based on ultrafast pulse measurementJournal articlehttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5350729