Evrard, OlivierOlivierEvrardDemesmaeker, ElsElsDemesmaekerVermeulen, TomTomVermeulenZagrebnov, MaximMaximZagrebnovCaymax, MattyMattyCaymaxLaureys, WimWimLaureysPoortmans, JefJefPoortmansNijs, JohanJohanNijsMertens, RobertRobertMertens2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/643The analysis of the limiting recombination mechanisms on high efficiency thin film cells grown with CVD epitaxyProceedings paper