Materials and defect aspects of III-V and III-N devices for high-speed analog/RF applications

Simoen, EddyEddySimoenHsu, BrentBrentHsuYu, HaoHaoYuWang, HongyueHongyueWangZhao, MingMingZhaoTakakura, KenichiroKenichiroTakakuraPutcha, VamsiVamsiPutchaPeralagu, UthayasankaranUthayasankaranPeralaguParvais, BertrandBertrandParvaisWaldron, NiamhNiamhWaldronCollaert, NadineNadineCollaert2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/35948Materials and defect aspects of III-V and III-N devices for high-speed analog/RF applicationsProceedings paper