Process-induced power-performance variability in sub-5nm III-V tunnel FETs

Xiang, YangYangXiangVerhulst, AnneAnneVerhulstYakimets, DmitryDmitryYakimetsParvais, BertrandBertrandParvaisMocuta, AndaAndaMocutaGroeseneken, GuidoGuidoGroeseneken2021-10-272021-10-272019-040018-9383https://imec-publications.be/handle/20.500.12860/34467Process-induced power-performance variability in sub-5nm III-V tunnel FETsJournal article10.1109/TED.2019.2909217