Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics

De Schepper, LucLucDe SchepperDe Ceuninck, WardWardDe CeuninckLekens, GeertGeertLekensStals, LambertLambertStalsVanhecke, BrunoBrunoVanheckeRoggen, JeanJeanRoggenBeyne, EricEricBeyneTielemans, LucLucTielemans2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/123Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronicsJournal article