Zhuge, JingJingZhugeVerhulst, AnneAnneVerhulstVandenberghe, WilliamWilliamVandenbergheDehaene, WimWimDehaeneHuang, RuRuHuangWang, YangYuanYangYuanWangGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110268-1242https://imec-publications.be/handle/20.500.12860/20230Digital-circuit analysis of short gate tunnel-FETs for low-voltage applicationsJournal articlehttp://iopscience.iop.org/0268-1242/26/8/085001/