Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability

Padovani, AndreaAndreaPadovaniArreghini, AntonioAntonioArreghiniVandelli, LucaLucaVandelliLarcher, LucaLucaLarcherVan den Bosch, GeertGeertVan den BoschVan Houdt, JanJanVan Houdt2021-10-202021-10-2020120003-6951https://imec-publications.be/handle/20.500.12860/21245Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliabilityJournal article