Eneman, GeertGeertEnemanCollaert, NadineNadineCollaertVeloso, AnabelaAnabelaVelosoDe Keersgieter, AnAnDe KeersgieterDe Meyer, KristinKristinDe MeyerHoffmann, ThomasThomasHoffmannHoriguchi, NaotoNaotoHoriguchiThean, AaronAaronThean2021-10-202021-10-2020120038-1101https://imec-publications.be/handle/20.500.12860/20652On the efficiency of stress techniques in gate-last n-type bulk FinFETsJournal article