Physical characterization of Cu2ZnGeSe4 thin films from annealing of Cu-Zn-Ge precursor layers

Buffiere, MarieMarieBuffiereElAnzeery, HossamHossamElAnzeeryOueslati, SouhaibSouhaibOueslatiBen Messaoud, KhaledKhaledBen MessaoudBrammertz, GuyGuyBrammertzMeuris, MarcMarcMeurisPoortmans, JefJefPoortmans2021-10-222021-10-2220150040-6090https://imec-publications.be/handle/20.500.12860/25026Physical characterization of Cu2ZnGeSe4 thin films from annealing of Cu-Zn-Ge precursor layersJournal articlehttp://www.sciencedirect.com/science/article/pii/S004060901400902X