On correlation between hot-carrier stress induced device parameter degradation and time-zero variability

Makarov, AlexanderAlexanderMakarovRoussel, PhilippePhilippeRousselBury, ErikErikBuryVandemaele, MichielMichielVandemaeleSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenKaczer, BenBenKaczerTyaginov, StanislavStanislavTyaginov2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33514On correlation between hot-carrier stress induced device parameter degradation and time-zero variabilityProceedings paperhttps://ieeexplore.ieee.org/abstract/document/8989882