Rolain, YvesYvesRolainVan Moer, W.W.Van MoerVandersteen, GerdGerdVandersteenVan Heijningen, MarcMarcVan Heijningen2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4704Measuring mixed signal substrate couplingProceedings paper