Kaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueGoes, WolfgangWolfgangGoesGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130167-9317https://imec-publications.be/handle/20.500.12860/22564Gate current random telegraph noise and single defect conductionJournal article