Van Daele, B.B.Van DaeleVan Tendeloo, G.G.Van TendelooRuythooren, WouterWouterRuythoorenDerluyn, JoffJoffDerluynLeys, MaartenMaartenLeysGermain, MarianneMarianneGermain2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11358Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaNProceedings paper