Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures

De Blauwe, JanJanDe BlauweWellekens, DirkDirkWellekensGroeseneken, GuidoGuidoGroesenekenHaspeslagh, LucLucHaspeslaghVan Houdt, JanJanVan HoudtDeferm, LudoLudoDefermMaes, HermanHermanMaes2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2480Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperaturesJournal article