Stochastic model for the RTS noise in submicron MOSFETs

Sikula, J.J.SikulaSikulova, M.M.SikulovaVasina, PetrPetrVasinaClaeys, CorCorClaeysSimoen, EddyEddySimoenDe Keersgieter, AnAnDe Keersgieter2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/866Stochastic model for the RTS noise in submicron MOSFETsProceedings paper