The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown

Rackauskas, BenBenRackauskasJ. Uren, MichaelMichaelJ. UrenStoffels, SteveSteveStoffelsZhao, MingMingZhaoBakeroot, BenoitBenoitBakerootDecoutere, StefaanStefaanDecoutereKuball, MartinMartinKuball2021-10-262021-10-2620180741-3106https://imec-publications.be/handle/20.500.12860/31583The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdownJournal articlehttps://ieeexplore.ieee.org/document/8450043