Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks

Kocak, Husnu MuratHusnu MuratKocakNaskali, Ahmet TeomanAhmet TeomanNaskaliPinarer, OzgunOzgunPinarerMitard, JeromeJeromeMitard2022-09-222022-07-022022-09-062022-09-222021-082639-1589WOS:000800559504120https://imec-publications.be/handle/20.500.12860/40041Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural NetworksProceedings paper10.1109/BigData52589.2021.9671667978-1-6654-3902-2WOS:000800559504120