DC and low-frequency noise behavior of the conductive filament in bipolar HfO2-based resistive random access memory

Maccaronio, A.A.MaccaronioCrupi, F.F.CrupiProcel, L.M.L.M.ProcelGoux, LudovicLudovicGouxSimoen, EddyEddySimoenTrojman, L.L.TrojmanMiranda, E.E.Miranda2021-10-212021-10-2120130167-9317https://imec-publications.be/handle/20.500.12860/22737DC and low-frequency noise behavior of the conductive filament in bipolar HfO2-based resistive random access memoryJournal article