Croon, JeroenJeroenCroonBiesemans, SergeSergeBiesemansKubicek, StefanStefanKubicekSimoen, EddyEddySimoenDe Meyer, KristinKristinDe MeyerClaeys, CorCorClaeys2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1785Freeze-out effects on the characteristics of deep submicron Si nMOSFETSs in the 77 K to 300 K rangeProceedings paper