Camillo, L.M.L.M.CamilloMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10171The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETsProceedings paper