Rasras, MahmoudMahmoudRasrasDe Wolf, IngridIngridDe WolfGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveMaes, HermanHermanMaes2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6752Origin of substrate hole current after gate oxide breakdownJournal article