Zahedmanesh, HoumanHoumanZahedmaneshVarela Pedreira, OlallaOlallaVarela PedreiraTokei, ZsoltZsoltTokeiCroes, KristofKristofCroes2022-03-112022-03-1120211541-7026WOS:000672563100003https://imec-publications.be/handle/20.500.12860/39427Electromigration limits of copper nano-interconnectsProceedings paper10.1109/IRPS46558.2021.9405091978-1-7281-6893-7WOS:000672563100003