Toledano Luque, MariaMariaToledano LuqueTang, BaojunBaojunTangDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerSimoen, EddyEddySimoenVan Houdt, JanJanVan HoudtGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21621Spectroscopic study of polysilicon traps by means of fast capacitance transientsMeeting abstract