A deep level study of high-temperature electron-irradiated n-type Cz silicon

Simoen, EddyEddySimoenClaeys, CorCorClaeysNeimash, V.V.NeimashKraitchinskii, A.A.KraitchinskiiKras'ko, M.M.Kras'koTischenko, V.V.TischenkoVoitovych, V.V.Voitovych2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9599A deep level study of high-temperature electron-irradiated n-type Cz siliconProceedings paper