Simoen, EddyEddySimoenVeloso, AnabelaAnabelaVelosoHoriguchi, NaotoNaotoHoriguchiClaeys, CorCorClaeys2021-10-202021-10-2020120741-3106https://imec-publications.be/handle/20.500.12860/21517Low-frequency noise assessment of the oxide quality of gate-last high-k pMOSFETSJournal articlehttp://ieeexplore.ieee.org/document/6296681/