Puglisi, Francesco MariaFrancesco MariaPuglisiCostantini, FelipeFelipeCostantiniKaczer, BenBenKaczerLarcher, LucaLucaLarcherPavan, PaoloPaoloPavan2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27169Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterizationProceedings paperhttp://ieeexplore.ieee.org/document/7599633/