A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies

Saraza-Canflanca, P.P.Saraza-CanflancaCarrasco-Lopez, H.H.Carrasco-LopezSantana-Andreo, A.A.Santana-AndreoDiaz Fortuny, JavierJavierDiaz FortunyCastro-Lopez, R.R.Castro-LopezRoca, E.E.RocaFernandez, F. V.F. V.Fernandez2023-04-252023-02-272023-04-2520221541-7026WOS:000922926400153https://imec-publications.be/handle/20.500.12860/41197A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS TechnologiesProceedings paper10.1109/IRPS48227.2022.9764587978-1-6654-7950-9WOS:000922926400153TIME-DEPENDENT VARIABILITYHOT-CARRIER DEGRADATIONBTI