Capacitance-voltage (CV) characterization of GaAs-oxide interfaces

Brammertz, GuyGuyBrammertzMartens, KoenKoenMartensLin, DennisDennisLinMerckling, ClementClementMercklingPenaud, JulienJulienPenaudAdelmann, ChristophChristophAdelmannSioncke, SonjaSonjaSionckeWang, Wei-EWei-EWangCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13447Capacitance-voltage (CV) characterization of GaAs-oxide interfacesMeeting abstract