Origin of NBTI variability in deeply scaled pFETs

Kaczer, BenBenKaczerGrasser, TiborTiborGrasserRoussel, PhilippePhilippeRousselFranco, JacopoJacopoFrancoDegraeve, RobinRobinDegraeveRagnarsson, Lars-AkeLars-AkeRagnarssonSimoen, EddyEddySimoenGroeseneken, GuidoGuidoGroesenekenReisinger, HansHansReisinger2021-10-182021-10-182010-05https://imec-publications.be/handle/20.500.12860/17336Origin of NBTI variability in deeply scaled pFETsProceedings paperhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5488856