Hayama, K.K.HayamaOhyama, H.H.OhyamaRafi, Joan MarcJoan MarcRafiMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/8999Linear kink effect induced drain current hysteresis in ultra thin gate oxide FD-SOI MOSFETsProceedings paper