Van Heijningen, MarcMarcVan HeijningenVandamme, EwoutEwoutVandammeDeferm, LudoLudoDefermVandamme, LorenzLorenzVandamme2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/3042Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedureProceedings paper