Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs

Karatsori, T.T.KaratsoriTheodorou, C.C.TheodorouLavieville, R.R.LavievilleChiarella, ThomasThomasChiarellaMitard, JeromeJeromeMitardHoriguchi, NaotoNaotoHoriguchiDimitriadis, C.AC.ADimitriadisGhibaudo, GérardGérardGhibaudo2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28641Statistical characterization and modeling of drain current local and global variability in 14nm FinFETsProceedings paperhttp://ieeexplore.ieee.org/document/7954263/