Kindl, D.D.KindlHubik, P.P.HubikKristofik, J.J.KristofikMares, J.J.J.J.MaresVyborny, Z.Z.VybornyLeys, MaartenMaartenLeysBoeykens, StevenStevenBoeykens2021-10-172021-10-1720090021-8979https://imec-publications.be/handle/20.500.12860/15601Deep defects in GaN/AlGaN/SiC heterostructuresJournal article