Girgis, E.E.GirgisBoeve, HansHansBoeveDe Boeck, JoJoDe BoeckSchelten, J.J.ScheltenRottlander, P.P.RottlanderKohlstedt, H.H.KohlstedtGrünberg, P.P.Grünberg2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4394Dielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation methodJournal article