X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

Wang, PengfeiPengfeiWangZhang, EnxiaEnxiaZhangChuang, KentKentChuangLiao, WenjunWenjunLiaoGong, HuiqiHuiqiGongWang, PanPanWangArutt, Charles NCharles NAruttNi, KaiKaiNiMcCurdy, MikeMikeMcCurdyVerbauwhede, IngridIngridVerbauwhedeBury, ErikErikBuryLinten, DimitriDimitriLintenFleetwood, DanielDanielFleetwoodSchrimpf, RonRonSchrimpfReed, RobertRobertReed2021-10-262021-10-2620180018-9499https://imec-publications.be/handle/20.500.12860/32243X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devicesJournal articlehttp://ieeexplore.ieee.org/document/8244298/