Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability Analysis

Alavi, OmidOmidAlaviVan Cappellen, LeanderLeanderVan CappellenDe Ceuninck, WardWardDe CeuninckDaenen, MichaëlMichaëlDaenen2023-01-172021-11-022023-01-1720212079-9292WOS:000694063700001https://imec-publications.be/handle/20.500.12860/37589Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability AnalysisJournal article10.3390/electronics10172095WOS:000694063700001GATE VOLTAGEMODULE