An easy-to-use mismatch model for the MOS transistor

Croon, JeroenJeroenCroonRosmeulen, MaartenMaartenRosmeulenDecoutere, StefaanStefaanDecoutereSansen, WillyWillySansenMaes, HermanHermanMaes2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6156An easy-to-use mismatch model for the MOS transistorJournal article