Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability

Franco, JacopoJacopoFrancoKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselToledano Luque, MariaMariaToledano LuqueWeckx, PieterPieterWeckxGrasser, TiborTiborGrasser2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22361Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI VariabilityProceedings paperhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6804161