Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit

Van Beek, SimonSimonVan BeekRoussel, PhilippePhilippeRousselO'Sullivan, BarryBarryO'SullivanDegraeve, RobinRobinDegraeveCosemans, StefanStefanCosemansLinten, DimitriDimitriLintenKar, Gouri SankarGouri SankarKar2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/32010Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fitProceedings paperhttps://ieeexplore.ieee.org/document/8486879