Deep learning-based 2D/3D registration of an atlas to biplanar X-ray images

Van Houtte, JeroenJeroenVan HoutteAudenaert, EmmanuelEmmanuelAudenaertZheng, GuoyanGuoyanZhengSijbers, JanJanSijbers2023-03-302022-03-292023-03-3020221861-6410WOS:000769839100003https://imec-publications.be/handle/20.500.12860/39545Deep learning-based 2D/3D registration of an atlas to biplanar X-ray imagesJournal article10.1007/s11548-022-02586-3WOS:000769839100003MEDLINE:35294717