Single event latch-up: increased sensitivity from planar to FinFET

Karp, JamesJamesKarpHart, Michael J.Michael J.HartMaillard, PierrePierreMaillardHellings, GeertGeertHellingsLinten, DimitriDimitriLinten2021-10-252021-10-2520180018-9499https://imec-publications.be/handle/20.500.12860/31019Single event latch-up: increased sensitivity from planar to FinFETJournal articlehttp://ieeexplore.ieee.org/document/8141939/