Interface and border traps in Ge pMOSFETs

Fleetwood, DanielDanielFleetwoodSimoen, EddyEddySimoenFrancis, SarahSarahFrancisZhang, C.X.C.X.ZhangArora, R.R.AroraZhang, E.X.E.X.ZhangSchrimpf, RonaldRonaldSchrimpfGalloway, KenKenGallowayMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20682Interface and border traps in Ge pMOSFETsMeeting abstract